Slew rate adjusting circuit for adjusting slew rate, buffer circuit including same, and slew rate adjusting method

ABSTRACT

A slew rate adjusting circuit includes an adjustment transistor configured to provide an adjustment current into an output port of an arithmetic amplifier, a first transistor connected between a power line of the arithmetic amplifier and the adjustment transistor, and a second transistor connected between the first transistor and an output node of the output port, wherein the adjustment transistor is turned on by the second transistor in response to a difference between an input voltage and an output voltage being equal to or greater than a reference voltage, and the adjustment current is provided to the output port in response to the adjustment transistor being turned on.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a division of U.S. application Ser. No. 16/830,387,filed on Mar. 26, 2020 which claims the benefit under 35 USC 119(a) ofKorean Patent Application No. 10-2019-0067454, filed on Jun. 7, 2019 inthe Korean Intellectual Property Office, the entire disclosure of whichis incorporated herein by reference for all purposes.

BACKGROUND 1. Field

The following description relates to a slew rate adjusting circuit. Thefollowing description also relates to a buffer circuit including a slewrate adjusting circuit. The following description also relates to a slewrate adjusting method.

2. Description of the Related Art

A buffer circuit may be used for performing a buffer function on asignal. For example, the buffer circuit may be used in various fields ofoutputting an output signal such as a source driving circuit and a gatedriving circuit of a display device, and so on.

Meanwhile, in the display field, because of an increase in capacitanceand a decrease in horizontal frequency caused by enlargement ofcircuits, a slew rate of the buffer circuit may become a factor that isto be considered when forming the buffer circuit.

SUMMARY

This Summary is provided to introduce a selection of concepts in asimplified form that are further described below in the DetailedDescription. This Summary is not intended to identify key features oressential features of the claimed subject matter, nor is it intended tobe used as an aid in determining the scope of the claimed subjectmatter.

In one general aspect, a slew rate adjusting circuit includes anadjustment transistor configured to provide an adjustment current intoan output port of an arithmetic amplifier, a first transistor connectedbetween a power line of the arithmetic amplifier and the adjustmenttransistor, and a second transistor connected between the firsttransistor and an output node of the output port, wherein the adjustmenttransistor is turned on by the second transistor in response to adifference between an input voltage and an output voltage being equal toor greater than a reference voltage, and the adjustment current isprovided to the output port in response to the adjustment transistorbeing turned on.

The adjustment current may be provided from the power line into theoutput node through the adjustment transistor.

The second transistor may be turned on in response to the differencebetween the input voltage and the output voltage being equal to orgreater than the reference voltage, the adjustment transistor may beturned on in response to the second transistor being turned on, and theadjustment current may be provided to the output node through theadjustment transistor in response to the adjustment transistor beingturned on.

The adjustment transistor, the first transistor, and the secondtransistor may be metal-oxide-semiconductor field-effect transistors(MOSFETs), a source terminal of the second transistor may be connectedto the output node, a drain terminal of the second transistor may beconnected to a gate terminal of the adjustment transistor, a sourceterminal of the adjustment transistor may be connected to the powerline, and a drain terminal of the adjustment transistor may be connectedto the output node.

The adjustment transistor and the second transistor may bemetal-oxide-semiconductor field-effect transistors (MOSFETs), a sourceterminal of the second transistor may be connected to the output node, adrain terminal of the second transistor may be connected to a gateterminal of the adjustment transistor, a source terminal of theadjustment transistor may be connected to the power line, and a drainterminal of the adjustment transistor may be connected to the outputnode.

The slew rate adjusting circuit may further include an enable transistorconnected to the adjustment transistor, the first transistor, and thesecond transistor, wherein the enable transistor may be configured tocontrol whether or not to turn on the second transistor in response toreceiving an enable signal.

A positive adjustment current may be provided through the adjustmenttransistor in response to the arithmetic amplifier operating through apull-up current.

A negative adjustment current may be provided through the adjustmenttransistor in response to the arithmetic amplifier operating through apull-down current.

The slew rate adjusting circuit may further include an additionaltransistor connected to the adjustment transistor, the first transistor,and the second transistor, wherein the second transistor may beconfigured to turn on the additional transistor in response to thedifference between the input voltage and the output voltage being equalto or greater than the reference voltage, and an additional current maybe provided to the output node in response to the additional transistorbeing turned on.

In another general aspect, a buffer circuit includes an arithmeticamplifier configured to output an output voltage through an output nodeby amplifying an input voltage, an adjustment current generating circuitconfigured to provide adjustment current to an output port of thearithmetic amplifier so as to adjust a slew rate of the output port, anda control circuit configured to control the adjustment currentgenerating circuit so as to provide the adjustment current in responseto a difference between the input voltage and the output voltage beingequal to or greater than a reference voltage.

The adjustment current generating circuit may further include anadjustment transistor connected between a power line of the arithmeticamplifier, the output node, and the control circuit, wherein theadjustment current may be provided to the output node through theadjustment transistor by the adjustment transistor being turned onaccording to a control of the control circuit, in response to thedifference between the input voltage and the output voltage being equalto or greater than the reference voltage.

The adjustment current may be provided from the power line to the outputnode through the adjustment transistor.

The control circuit may include a first transistor connected to thepower line, and a second transistor connected between the firsttransistor and the output node, wherein the adjustment transistor may beturned on by the second transistor in response to the difference betweenthe input voltage and the output voltage being equal to or greater thanthe reference voltage.

The adjustment transistor and the second transistor may bemetal-oxide-semiconductor field-effect transistors (MOSFETs), wherein asource terminal of the second transistor may be connected to the outputnode, a drain terminal of the second transistor may be connected to agate terminal of the adjustment transistor, a source terminal of theadjustment transistor may be connected to the power line, and a drainterminal of the adjustment transistor may be connected to the outputnode.

The buffer circuit may further include an enable transistor connected tothe adjustment transistor, the first transistor, and the secondtransistor, wherein the enable transistor may be configured to controlwhether or not to turn on the second transistor in response to an enablesignal.

The buffer circuit may further include an additional transistorconnected to the adjustment transistor, the first transistor, and thesecond transistor, wherein the additional transistor may be turned on bythe second transistor in response to the difference between the inputvoltage and the output voltage being equal to or greater than thereference voltage, and additional current may be provided to the outputnode in response to the additional transistor being turned on.

In another general aspect, a slew rate adjusting method includesreceiving an input voltage input to an arithmetic amplifier, receivingan output voltage output from the arithmetic amplifier, and providingadjustment current to an output port of the arithmetic amplifier on thebasis of a difference between the input voltage and the output voltageso as to decrease a transition time of the output voltage.

The providing of the adjustment current may include providing theadjustment current in response to the difference between the inputvoltage and the output voltage being equal to or greater than areference voltage.

A slew rate of an example where the difference between the input voltageand the output voltage is equal to or greater than the reference voltagemay be greater than a slew rate of an example where the differencebetween the input voltage and the output voltage is smaller than thereference voltage.

A size of the adjustment current may be determined on the basis of thedifference between the input voltage and the output voltage.

In another general aspect, a slew rate adjusting circuit includes anadjustment transistor, a first transistor connected between a power lineof an arithmetic amplifier and the adjustment transistor, and a secondtransistor connected between the first transistor and an output node ofan output port of the arithmetic amplifier, wherein the adjustmenttransistor is turned on by the second transistor in response to adifference between an input voltage and an output voltage being equal toor greater than a reference voltage, and the adjustment transistorprovides an adjustment current into the output port in response to beingturned on.

The adjustment current may be provided from the power line into theoutput node through the adjustment transistor.

The second transistor may be turned on in response to the differencebetween the input voltage and the output voltage being equal to orgreater than the reference voltage, the adjustment transistor may beturned on in response to the second transistor being turned on, and theadjustment current may be provided to the output node through theadjustment transistor in response to the adjustment transistor beingturned on.

The adjustment transistor, the first transistor, and the secondtransistor may be metal-oxide-semiconductor field-effect transistors(MOSFETs), a source terminal of the second transistor may be connectedto the output node, a drain terminal of the second transistor may beconnected to a gate terminal of the adjustment transistor, a sourceterminal of the adjustment transistor may be connected to the powerline, and a drain terminal of the adjustment transistor may be connectedto the output node.

Other features and aspects will be apparent from the following detaileddescription, the drawings, and the claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a view showing a buffer circuit according to an example.

FIG. 2 is a view showing an arithmetic amplifier and a slew rateadjusting circuit according to an example.

FIG. 3 is a view showing in detail a buffer circuit according to anexample.

FIG. 4 is a view of a graph showing an output voltage according towhether or not the slew rate adjusting circuit is present according toan example.

FIG. 5 is a view showing in detail a buffer circuit according to anexample.

FIG. 6 is a view showing in detail a buffer circuit according to anexample.

FIG. 7 is a view showing a flowchart of a slew rate adjusting methodaccording to an example.

FIG. 8 is a view conceptually showing a display device including abuffer circuit according to an example.

Throughout the drawings and the detailed description, the same referencenumerals refer to the same elements. The drawings may not be to scale,and the relative size, proportions, and depiction of elements in thedrawings may be exaggerated for clarity, illustration, and convenience.

DETAILED DESCRIPTION

The following detailed description is provided to assist the reader ingaining a comprehensive understanding of the methods, apparatuses,and/or systems described herein. However, various changes,modifications, and equivalents of the methods, apparatuses, and/orsystems described herein will be apparent after an understanding of thedisclosure of this application. For example, the sequences of operationsdescribed herein are merely examples, and are not limited to those setforth herein, but may be changed as will be apparent after anunderstanding of the disclosure of this application, with the exceptionof operations necessarily occurring in a certain order. Also,descriptions of features that are known in the art may be omitted forincreased clarity and conciseness.

The features described herein may be embodied in different forms, andare not to be construed as being limited to the examples describedherein. Rather, the examples described herein have been provided merelyto illustrate some of the many possible ways of implementing themethods, apparatuses, and/or systems described herein that will beapparent after an understanding of the disclosure of this application.

Throughout the specification, when an element, such as a layer, region,or substrate, is described as being “on,” “connected to,” or “coupledto” another element, it may be directly “on,” “connected to,” or“coupled to” the other element, or there may be one or more otherelements intervening therebetween. In contrast, when an element isdescribed as being “directly on,” “directly connected to,” or “directlycoupled to” another element, there can be no other elements interveningtherebetween.

As used herein, the term “and/or” includes any one and any combinationof any two or more of the associated listed items.

Although terms such as “first,” “second,” and “third” may be used hereinto describe various members, components, regions, layers, or sections,these members, components, regions, layers, or sections are not to belimited by these terms. Rather, these terms are only used to distinguishone member, component, region, layer, or section from another member,component, region, layer, or section. Thus, a first member, component,region, layer, or section referred to in examples described herein mayalso be referred to as a second member, component, region, layer, orsection without departing from the teachings of the examples.

Spatially relative terms such as “above,” “upper,” “below,” and “lower”may be used herein for ease of description to describe one element'srelationship to another element as shown in the figures. Such spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. For example, if the device in the figures is turned over,an element described as being “above” or “upper” relative to anotherelement will then be “below” or “lower” relative to the other element.Thus, the term “above” encompasses both the above and below orientationsdepending on the spatial orientation of the device. The device may alsobe oriented in other ways (for example, rotated 90 degrees or at otherorientations), and the spatially relative terms used herein are to beinterpreted accordingly.

The terminology used herein is for describing various examples only, andis not to be used to limit the disclosure. The articles “a,” “an,” and“the” are intended to include the plural forms as well, unless thecontext clearly indicates otherwise. The terms “comprises,” “includes,”and “has” specify the presence of stated features, numbers, operations,members, elements, and/or combinations thereof, but do not preclude thepresence or addition of one or more other features, numbers, operations,members, elements, and/or combinations thereof.

Due to manufacturing techniques and/or tolerances, variations of theshapes shown in the drawings may occur. Thus, the examples describedherein are not limited to the specific shapes shown in the drawings, butinclude changes in shape that occur during manufacturing.

The features of the examples described herein may be combined in variousways as will be apparent after an understanding of the disclosure ofthis application. Further, although the examples described herein have avariety of configurations, other configurations are possible as will beapparent after an understanding of the disclosure of this application.

Herein, it is noted that use of the term “may” with respect to anexample or embodiment, e.g., as to what an example or embodiment mayinclude or implement, means that at least one example or embodimentexists where such a feature is included or implemented while allexamples and embodiments are not limited thereto.

The examples have been made keeping in mind the above problems occurringin the related art, and an objective of the examples is to provide aslew rate adjusting circuit capable of improving a slew rate of anoutput port of an arithmetic amplifier without an increase in currentconsumption in the output port, a buffer circuit including the same, anda slew rate adjusting method.

A slew rate adjusting circuit according to examples may improve a slewrate of the arithmetic amplifier by providing an adjustment current tothe arithmetic amplifier when a difference between an input voltage andan output voltage exceeds a threshold voltage, providing for a FastSlew.

A slew rate adjusting circuit according to examples may increase a slewrate in the output port without causing a change in consumption currentin the output port, and thus a device may be prevented from being heatedexcessively.

FIG. 1 is a view showing a buffer circuit according to an example.Referring to the example of FIG. 1 , a buffer circuit 100 may receive aninput voltage VIN, and may output an output voltage VOUT by using theinput voltage VIN. According to examples, the buffer circuit 100 mayperform a buffer function on the input voltage VIN, and may output theoutput voltage VOUT that is the result of the buffer function. Forexample, the output voltage VOUT may be generated by the buffer circuit100 by amplifying the input voltage VIN.

Meanwhile, in the present disclosure, receiving an arbitrary voltage maymean that a line, from which the arbitrary voltage is supplied, and acorresponding configuration are electrically connected.

The buffer circuit 100 may include an arithmetic amplifier 110 and aslew rate adjusting circuit 120. According to non-limiting examples, thebuffer circuit 100 may include a plurality of arithmetic amplifiers anda plurality of slew rate adjusting circuits, but a single arithmeticamplifier 110 and a slew rate adjusting circuit 120 may suffice, inother non-limiting examples.

The arithmetic amplifier 110 may output the output voltage VOUT byamplifying the input voltage VIN. Ideally, the arithmetic amplifier 110may output the output voltage VOUT by immediately responding to theinput of the input voltage VIN. However, practically, in a transitionfrom the input voltage VIN to the output voltage VOUT, a time, that is,a transition time, may elapse. Such a transition time may be consideredas being a slew rate for the arithmetic amplifier 110.

The slew rate adjusting circuit 120 may adjust a slew rate of thearithmetic amplifier 110. According to an example, the slew rateadjusting circuit 120 may receive the input voltage VIN and the outputvoltage VOUT from the arithmetic amplifier 110, and may adjust atransition time from the input voltage VIN to the output voltage VOUT onthe basis of the received input voltage VIN and the output voltage VOUT.For example, the slew rate adjusting circuit 120 may be activated whenan absolute value of a difference between the input voltage VIN and theoutput voltage VOUT of the arithmetic amplifier 110 exceeds a referencevalue, and may accordingly decrease a transition time from the inputvoltage VIN to the output voltage VOUT.

FIG. 2 is a view showing the arithmetic amplifier and the slew rateadjusting circuit according to an example. Referring to the examples ofFIGS. 1 and 2 , the arithmetic amplifier 110 may include an input port111, a load 113, and an output port 115.

The input port 111 may receive the input voltage VIN and the outputvoltage VOUT, and may determine a difference in size between the inputvoltage VIN and the output voltage VOUT. Also, in the example of FIG. 2, the input port 111 of the arithmetic amplifier 110 may be electricallyconnected to the load 113.

The load 113 may determine a gain of the arithmetic amplifier 110.According to an example, the load 113 may amplify the input voltage VINaccording to the determined gain, and may transfer the resulting inputvoltage to the output port 115.

The load 113 may transmit a driving signal DS so as to control theoutput port 115. For example, the driving signal DS may be a pull-upcurrent or a pull-down current used in the arithmetic amplifier 110.

The output port 115 may output the output voltage VOUT in response tothe driving signal DS. According to an example, the output port 115 mayoutput the output voltage VOUT as a result of being turned on by thedriving signal DS.

The output port 115 may receive adjustment current ADI from the slewrate adjusting circuit 120, and as a result, the slew rate of the outputport 115 can be adjusted.

The output voltage VOUT output from the output port 115 may be providedto the input port 111 again.

According to the example of FIG. 2 , the slew rate adjusting circuit 120may include an adjustment current generating circuit 121 and a controlcircuit 123.

In such an example, the adjustment current generating circuit 121 may beconnected to the output port 115 of the arithmetic amplifier 110. Theadjustment current generating circuit 121 may adjust a slew rate of theoutput port 115 by providing an adjustment current ADI to the outputport 115. According to an example, the adjustment current generatingcircuit 121 may provide the adjustment current ADI to the output port115. Thus, the adjustment current generating circuit 121 may adjust aslew rate of the output port 115 by enabling a transition from the inputvoltage VIN to the output voltage VOUT to be faster than the slew ratewas before, at an earlier time when the input voltage VIN istransitioned to the output voltage VOUT through the output port 115.

Meanwhile, a direction of the current flowing of the adjustment currentADI is not limited, providing that, by the operation of adjustmentcurrent generating circuit 121, an adjustment current ADI to the outputport 115 may include an example where current flows from the output port115 into the adjustment current generating circuit 121, and an examplewhere current flows from the adjustment current generating circuit 121into the output port 115.

The control circuit 123 may output a control signal CS for controllingthe adjustment current generating circuit 121. According to an example,the control circuit 123 may output a control signal CS into theadjustment current generating circuit 121 according to a differencebetween the input voltage VIN and the output voltage VOUT. Also, theadjustment current generating circuit 121 may provide adjustment currentADI into the output port 115 by being activated or enabled, in responseto the control signal CS.

The slew rate adjusting circuit 120 according to an example may adjust aslew rate of the output port 115 according to a difference between theinput voltage VIN and the output voltage VOUT.

FIG. 3 is a view showing in detail the buffer circuit according to anexample. Referring to the examples of FIGS. 1 to 3 , the output port 115may receive power source voltages VDD1 and VDD2 by being connected topower lines VL1 and VL2. For example, a first power source voltage VDD1may be greater than a second power source voltage VDD2.

The output port 115 may include two driving transistors DTR1 and DTR2.According to an example, the output port 115 may include a first drivingtransistor DTR1 connected between the first power line VL1 and an outputnode NOUT, and a second driving transistor DTR2 connected to a secondpower line VL2 and the output node NOUT.

According to an example, the first driving transistor DTR1 may be a PMOStransistor, and the second driving transistor DTR2 may be an NMOStransistor. In such an example, a gate terminal of the first drivingtransistor DTR1 may be connected to the load 113, a source terminal ofthe first driving transistor DTR1 may be connected to the first powerline VL1, and a drain terminal of the first driving transistor DTR1 maybe connected to the output node NOUT. Additionally, a gate terminal ofthe second driving transistor DTR2 may be connected to the load 113, asource terminal of the second driving transistor DTR2 may be connectedto the second power line VL2, and a drain terminal of the second drivingtransistor DTR2 may be connected to the output node NOUT.

The first driving transistor DTR1 may be turned on in response toreceiving a first driving signal DS1 transferred from the load 113, andthe second driving transistor DTR2 may be turned on by receiving asecond driving signal DS2 transferred from the load 113. According to anexample, the first driving transistor DTR1 may be a pull-up transistor,and the second driving transistor DTR2 may be a pull-down transistor.

The first driving transistor DTR1 and the second driving transistor DTR2may operate in a complementary manner. For example, when the firstdriving transistor DTR1 is turned on, the second driving transistor DTR2may be turned off, and vice versa.

The adjustment current generating circuit 121 may be connected to theoutput node NOUT. According to an example, the adjustment currentgenerating circuit 121 may include two adjustment transistors MTR1 andMTR2 for providing an adjustment current to the output node NOUT.

For example, the adjustment current generating circuit 121 may include afirst adjustment transistor MTR1 connected between the first power lineVL1 and the output node NOUT, and may include a second adjustmenttransistor MTR2 connected between the second power line VL2 and theoutput node NOUT.

According to a non-limiting example, the first adjustment transistorMTR1 may be a PMOS, and the second adjustment transistor MTR2 may be anNMOS. In such an example, a gate terminal of the first adjustmenttransistor MTR1 may be connected to the control circuit 123, a sourceterminal of the first adjustment transistor MTR1 may be connected to thefirst power line VL1, and a drain terminal of the first adjustmenttransistor MTR1 may be connected to the output node NOUT and the load113. A gate terminal of the second adjustment transistor MTR2 may beconnected to the control circuit 123, a source terminal of the secondadjustment transistor MTR2 may be connected to the second power lineVL2, and a drain terminal of the second adjustment transistor MTR2 maybe connected to the output node NOUT and the load 113. For example,compensation capacitors CP1 and CP2 may be respectively connectedbetween the adjustment transistors MTR1 and MTR2 and the load 113. Insuch an example, a first compensation capacitor CP1 may be connectedbetween the first adjustment transistor MTR1 and the load 113, and asecond compensation capacitor CP2 may be connected between the secondadjustment transistor MTR2 and the load 113. The compensation capacitorsCP1 and CP2 may be used for Miller compensation, where Millercompensation is a technique for stabilizing the circuit usingcapacitances with a negative feedback approach.

The first adjustment transistor MTR1 may be turned on in responsereceiving to a first control signal CS1 transferred from the controlcircuit 123, and the second adjustment transistor MTR2 may be turned onin response to receiving a second control signal CS2 transferred fromthe control circuit 123.

The control circuit 123 may output control signals CS1 and CS2 foractivating the adjustment current generating circuit 121. According toan example, the control circuit 123 may include a first transistor TR1,a second transistor TR2, a third transistor TR3, and a fourth transistorTR4.

The first transistor TR1 may be connected to the first power line VL1,and the second transistor TR2 may be connected between the firsttransistor TR1 and the output node NOUT. According to an example, afirst adjustment transistor MTR1 may be connected between the firsttransistor TR1 and the second transistor TR2.

According to a non-limiting example, the first transistor TR1 may be aPMOS transistor, and the second transistor TR2 may be an NMOStransistor. In such an example, a gate terminal of the first transistorTR1 may be connected to the load 113, a source terminal of the firsttransistor TR1 may be connected to the first power line VL1, and a drainterminal of the first transistor TR1 may be connected to a drainterminal of the second transistor TR2 and to a gate terminal of thefirst adjustment transistor MTR1. Also, in such an example, a gateterminal of the second transistor TR2 may receive the input voltage VIN,the drain terminal of the second transistor TR2 may be connected to thedrain terminal of the first transistor TR1 and to the gate terminal ofthe first adjustment transistor MTR1, and a source terminal of thesecond transistor TR2 may be connected to the output node NOUT.

The second transistor TR2 may be turned on when an absolute value of adifference between the input voltage VIN and the output voltage VOUT isequal to or greater than an absolute value of a threshold voltage of thesecond transistor TR2. For example, when the second transistor TR2 is anNMOS, the second transistor TR2 may be turned on when a differencebetween the input voltage VIN and the output voltage VOUT is equal to orgreater than a threshold voltage of the second transistor TR2.

Meanwhile, operational conditions of an NMOS and a PMOS may besubstantially identical, but simply differing in sign. Thus, “adifference between the input voltage VIN and the output voltage VOUT,”may correspond to an absolute value. Accordingly, hereinafter, forconvenience of description, in the examples, it may be assumed that adifference between the input voltage VIN and the output voltage VOUTbeing equal to or greater than a threshold voltage means that anabsolute value of a difference between the input voltage VIN and theoutput voltage VOUT is equal to or greater than an absolute value of athreshold voltage, given that the use of the absolute value operationresults in a magnitude of the relevant calculation, in that sign is notimportant to these considerations.

According to a non-limiting example, the third transistor TR3 may be anNMOS transistor, and the fourth transistor TR4 may be a PMOS transistor.In such an example, a gate terminal of the third transistor TR3 may beconnected to the load 113, a source terminal of the third transistor TR3may be connected to the second power line VL2, and a drain terminal ofthe third transistor TR3 may be connected to a drain terminal of thefourth transistor TR4 and a gate terminal of a second adjustmenttransistor MTR2. Also, in such an example, a gate terminal of the fourthtransistor TR4 may receive the input voltage VIN, the drain terminal ofthe fourth transistor TR4 may be connected to the drain terminal of thethird transistor TR3 and the gate terminal of the second adjustmenttransistor MTR2, and a source terminal of the fourth transistor TR4 maybe connected to the output node NOUT.

In an example, the fourth transistor TR4 may be turned on when adifference between the input voltage VIN and the output voltage VOUT isequal to or greater than a threshold voltage of the fourth transistorTR4.

Hereinafter, referring to the example of FIG. 3 , an operation of theslew rate adjusting circuit 120 is described in further detail. Asdescribed in further detail above, a time, that is, a transition time,may elapse during a transition from the input voltage VIN to the outputvoltage VOUT, and the slew rate adjusting circuit 120 of an example maybe able to improve a slew rate without causing an increase in currentconsumption. According to an example, threshold voltages of alltransistors shown in the example of FIG. 3 may be identical.

Operations of the slew rate adjusting circuit 120 when the first drivingtransistor DTR1 is turned on are to be described in further detail. In apull-up operation, when the input voltage VIN is input, the firstdriving transistor DTR1 may be turned on by controlling the load 113,and may output the output voltage VOUT.

In such an example, it may be assumed that a difference between theinput voltage VIN and the output voltage VOUT may exceed a thresholdvoltage. For example, the input voltage VIN may match a first powersource voltage VDD1. In such an example, the second transistor TR2 mayturned on, as a result. Accordingly, the first adjustment transistorMTR1 may be turned on by receiving a voltage from a node X1. In otherwords, the second transistor TR2 may output a first control signal CS1for turning on the first adjustment transistor MTR1. When the firstadjustment transistor MTR1 is turned on, a first adjustment current ADImay be transferred into the output node NOUT by the first adjustmenttransistor MTR1 on the basis of the first power source voltage. As aresult, a transition time to the output voltage VOUT in the output nodeNOUT may decrease, and thus a slew rate of the output port 115 mayincrease as a result.

For example, first adjustment current ADI1 may be provided from thefirst power line VL1 into the output node NOUT through the firstadjustment transistor MTR1.

In other words, the slew rate adjusting circuit 120 may increase a slewrate of the output port 115 when a difference between the input voltageVIN and the output voltage VOUT exceeds a threshold voltage.

Subsequently, when a difference between the input voltage VIN and theoutput voltage VOUT does not exceed a threshold voltage, the secondtransistor TR2 may be turned off, and the first adjustment transistorMTR1 may be turned off by receiving a voltage from the node X1. In otherwords, the second transistor TR2 may output a first control signal CS1for turning off the first adjustment transistor MTR1. The output voltageVOUT may be output by turning off the first adjustment transistor MTR1,and by only turning on the first driving transistor DTR1.

In other words, the slew rate adjusting circuit 120 may be deactivatedwhen a difference between the input voltage VIN and the output voltageVOUT does not exceed a threshold voltage.

Operations of the slew rate adjusting circuit 120 when the seconddriving transistor DTR2 is turned on are similar to the operationsdiscussed in further detail, above. In pull-down operation, when theinput voltage VIN is input, second driving transistor DTR2 may be turnedon by a control of the load 113, and may output the output voltage VOUT.

In such an example, it may be assumed that a difference between theinput voltage VIN and the output voltage VOUT exceeds a thresholdvoltage. For example, the input voltage VIN may be a second power sourcevoltage VDD2. In such an example, the fourth transistor TR4 may beturned on, and the second adjustment transistor MTR2 may be turned on byreceiving a voltage from a node X2. In other words, the fourthtransistor TR4 may output a second control signal CS2 for tuning on thesecond adjustment transistor MTR2. The second adjustment transistor MTR2may be turned on as a result, and thus second adjustment current AD12may be transferred into the output node NOUT by the second adjustmenttransistor MTR2 based on the second power source voltage VDD2. As aresult, a transition time to the output voltage VOUT in the output nodeNOUT may decrease, and thus a slew rate of the output port 115 mayincrease as a result.

For example, the second adjustment current AD12 may be provided from thesecond power line VL2 into the output node NOUT through the secondadjustment transistor MTR2.

Subsequently, when a difference between the input voltage VIN and theoutput voltage VOUT does not exceed a threshold voltage, the fourthtransistor TR4 may be turned off, and the second adjustment transistorMTR2 may be turned off by receiving a voltage from a node X2. In otherwords, the fourth transistor TR4 may output a second control signal CS2for turning off the second adjustment transistor MTR2. The outputvoltage VOUT may be output by turning off the second adjustmenttransistor MTR2 and by only turning on second driving transistor DTR2.

Accordingly, the slew rate adjusting circuit 120 according to examplesmay increase a slew rate of the output port 115 by providing adjustmentcurrent ADI into the output port 115. In particular, adjustment currentADI provided from the slew rate adjusting circuit 120 may not flow intothe driving transistors DTR1 and DTR2, and thus changes in currentconsumption in the driving transistors may not occur.

In other words, the slew rate adjusting circuit 120 according to anexample may increase a slew rate of the output port 115 without causingan increase in current consumption of the output port 115. In otherwords, the device may be prevented from being overheated where theincreased slew rate would otherwise lead to a high current consumptionthat would generate a large amount of heat production.

In addition, according to the slew rate adjusting circuit 120 accordingto examples, a current level of the adjustment current ADI may bedetermined based on a difference between the input voltage VIN and theoutput voltage VOUT, that is, a characteristic of the transistor, andwhen a difference between the input voltage VIN and the output voltageVOUT becomes large, an improvement in slew rate may be achieved, in thatthe slew rate may be increased as a result of features of examples.

FIG. 4 is a view of a graph showing an output voltage according towhether or not the slew rate adjusting circuit is present according toexamples. Referring to the examples of FIGS. 1 to 4 , it is confirmed bythe illustrated information presented in the graph of FIG. 4 that a slewrate {circle around (1)} of the output port when the slew rate adjustingcircuit 120 according to an example is present may be greater than aslew rate {circle around (2)} of the output port when the slew rateadjusting circuit 120 is not provided. Particularly, as described infurther detail above, the slew rate adjusting circuit 120 may increase aslew rate of the output port 115 by providing adjustment current ADI tothe output port 115 when a difference between the input voltage VIN andthe output voltage VOUT exceeds a threshold voltage, shown in FIG. 4 asthe fast slew section.

FIG. 5 is a view showing in detail a buffer circuit according to anexample. Referring to the examples of FIGS. 1 to 5 , the control circuit123 of the example of FIG. 5 may be identical to the control circuit 123of the example of FIG. 4 , but the control circuit 123 of the example ofFIG. 5 may differ in that it may further include enable transistors ETR1and ETR2.

A first enable transistor ETR1 may be connected between the firsttransistor TR1 and the second transistor TR2, and a second enabletransistor ETR2 may be connected between the third transistor TR3 andthe fourth transistor TR4. According to a non-limiting example, thefirst enable transistor ETR1 may be a PMOS transistor, and the secondenable transistor ETR2 may be an NMOS transistor.

For example, the first enable transistor ETR1 may be turned on inresponse to receiving a first enable signal EN1. A source terminal ofthe first enable transistor ETR1 may be connected between the drainterminal of the first transistor TR1 and the gate terminal of the firstadjustment transistor MTR1. A drain terminal of the first enabletransistor ETR1 may be connected to the drain terminal of the secondtransistor TR2. The second enable transistor ETR2 may be turned on inresponse to receiving a second enable signal EN2. A source terminal ofthe second enable transistor ETR2 may be connected between the drainterminal of the third transistor TR3 and the gate terminal of the secondadjustment transistor MTR2. A drain terminal of the second enabletransistor ETR2 may be connected to the drain terminal of the fourthtransistor TR4.

According to a non-limiting example, a first enable signal EN1 providedto the first enable transistor ETR1 may be a second power source voltageVDD2 or a ground voltage, and a second enable signal EN2 provided to thesecond enable transistor ETR2 may be a first power source voltage VDD1,but EN1 and EN2 not limited to such examples, and other voltages may beused for EN1 and/or EN2 in other examples.

A determination of whether or not to output control signals CS1 and CS2may be set through manipulating the enable transistors ETR1 and ETR2.According to an example, whether or not to turn on the second transistorTR2 may be determined on the basis of whether or not the first enabletransistor ETR1 is turned on. Accordingly, whether or not to output thefirst control signal CS1 may be determined based on such approaches, aswell. In addition, whether or not to turn on the fourth transistor TR4may be determined based on whether or not the second enable transistorETR2 is turned on. Accordingly, whether or not to output the secondcontrol signal CS2 may be determined based on such approaches, as well.

In other words, the enable transistors ETR1 and ETR2 of the example ofFIG. 5 may be transistors for setting whether or not to enable the slewrate adjusting circuit 120. When the enable transistors ETR1 and ETR2are turned off, the slew rate adjusting circuit 120 may be alsodeactivated accordingly, and when the enable transistors ETR1 and ETR2are turned on, the slew rate adjusting circuit 120 may also be activatedaccordingly.

Operations of the slew rate adjusting circuit 120 when the enabletransistors ETR1 and ETR2 are turned are is identical to those of theslew rate adjusting circuit 120 described with reference to the exampleof FIG. 4 , above, and thus a description of such operations is omitted,for brevity.

FIG. 6 is a view showing in detail a buffer circuit according to anexample. Referring to the examples of FIGS. 1 to 6 , the control circuit123 of the example of FIG. 6 may be identical to the control circuit 123of FIG. 4 differing in further including a first additional transistorATR1 and a second additional transistor ATR2.

The first additional transistor ATR1 may be connected to the firsttransistor TR1, the first adjustment transistor MTR1, the load 113, andthe second transistor TR2. The second additional transistor ATR2 may beconnected to the third transistor TR3, the second adjustment transistorMTR2, the load 113, and the fourth transistor TR4. According to anexample, the first additional transistor ATR1 may be a PMOS transistor,and the second additional transistor ATR2 may be an NMOS transistor.

For example, a gate terminal of the first additional transistor ATR1 maybe connected between the first transistor TR1 and the second transistorTR2, a source terminal of the first additional transistor ATR1 may beconnected to the load 113 and the first compensation capacitor CP1, anda drain terminal of the first additional transistor ATR1 may beconnected to the source terminal of the second transistor TR2. A gateterminal of the second additional transistor ATR2 may be connectedbetween the third transistor TR3 and the fourth transistor TR4, a sourceterminal of the second additional transistor ATR2 may be connectedbetween the load 113 and the second compensation capacitor CP2, and adrain terminal of the second additional transistor ATR2 may be connectedto the source terminal of the fourth transistor TR4.

The operation of the slew rate adjusting circuit 120 when the firstdriving transistor DTR1 is turned on is described in further detail,below. In pull-up operation, when the input voltage VIN is input, thefirst driving transistor DTR1 may be turned on based on a controlling ofthe load 113, and the first driving transistor DTR1 may output theoutput voltage VOUT.

In such an example, it may be assumed that a difference between theinput voltage VIN and the output voltage VOUT exceeds a thresholdvoltage. For example, the input voltage VIN may be a first power sourcevoltage VDD1. In such an example, the second transistor TR2 may beturned on. Accordingly, both of the first adjustment transistor MTR1 andthe first additional transistor ATR1 may be turned on by receiving avoltage from a node X1. When both of the first adjustment transistorMTR1 and the first additional transistor ATR1 are turned on, firstadjustment current ADI1 may be transferred into the output node NOUT bythe first adjustment transistor MTR1, on the basis of the first powersource voltage VDD1. Additionally, differing from the example of FIG. 4, first additional current may be also transferred into the output nodeNOUT by the first additional transistor ATR1. As a result, a transitiontime to the output voltage VOUT in the output node NOUT may decrease,and thus a slew rate of the output port 115 may increase, accordingly.

For example, the first additional current may be provided from the load113 into the output node NOUT through the first additional transistorATR1.

Assuming that remaining configurations, other than the inclusion of thefirst additional transistor ATR1, of the circuit are identical, anincrease in slew rate by the slew rate adjusting circuit 120 of theexample of FIG. 6 may be greater than an increase in slew rate occurringby the use of the slew rate adjusting circuit 120 of FIG. 4 .

Subsequently, when a difference between the input voltage VIN and theoutput voltage VOUT does not exceed a threshold voltage, the secondtransistor TR2 may be turned off, and the first adjustment transistorMTR1 and the first additional transistor ATR1 may be turned off by avoltage of a node X1, as well. The output voltage VOUT is output by onlyturning on the first driving transistor DTR1.

Operations of the slew rate adjusting circuit 120 when second drivingtransistor DTR2 is turned on are similar to those discussed above. In apull-down operation, when the input voltage VIN is input, second drivingtransistor DTR2 may be turned on by a control of the load 113, and mayoutput the output voltage VOUT, accordingly.

In this disclosure, it is assumed that a difference between the inputvoltage VIN and the output voltage VOUT may exceed a threshold voltage.For example, the input voltage VIN may be a second power source voltageVDD2. In such an example, the fourth transistor TR4 may be turned on.Accordingly, both of the second adjustment transistor MTR2 and thesecond additional transistor ATR2 may be turned on by receiving avoltage from a node X2. When both of the second adjustment transistorMTR2 and the second additional transistor ATR2 are turned on, secondadjustment current AD12 may be transferred to the output node NOUT bythe second adjustment transistor MTR2 based on the second power sourcevoltage VDD2. Additionally, distinct from the example of FIG. 4 , secondadditional current may be also be transferred to the output node NOUT bythe second additional transistor ATR2. As a result, a transition time tothe output voltage VOUT in the output node NOUT may decrease, and thus aslew rate of the output port 115 may increase, accordingly.

For example, the second additional current may be provided from the load113 to the output node NOUT through the second additional transistorATR2.

Subsequently, when a difference between the input voltage VIN and theoutput voltage VOUT does not exceed a threshold voltage, the fourthtransistor TR4 may be turned off, and the second adjustment transistorMTR2 and the second additional transistor ATR2 may be turned off byreceiving a voltage from the node NOUT. The output voltage VOUT may beoutput by only turning on second driving transistor DTR2.

In examples, when sizes of respective transistors of the slew rateadjusting circuit 120 are appropriately adjusted, such as in keepingwith the discussion above, as a non-limiting example, the sum ofdimensions or sizes of transistors included in the slew rate adjustingcircuit 120 of the example of FIG. 6 may be identical to the sum ofdimensions of transistors included in the slew rate adjusting circuit120 of the example of FIG. 4 .

FIG. 7 is a view showing a flowchart of a slew rate adjusting methodaccording to an example. The slew rate adjusting method shown in theexample of FIG. 7 may be performed by the slew rate adjusting circuit120 as described with reference to the examples of FIGS. 1 to 6 .

Referring to the examples of FIGS. 1 to 7 , in S110, the slew rateadjusting circuit 120 may receive an input voltage VIN input into thearithmetic amplifier 110. According to an example, the input voltage VINinput to the arithmetic amplifier 110 may be input into at least one ofthe transistors included in the slew rate adjusting circuit 120.

In S120, the slew rate adjusting circuit 120 may receive an outputvoltage VOUT output from the arithmetic amplifier 110. According to anexample, the output voltage VOUT output from arithmetic amplifier 110may be input to at least one of transistors included in the slew rateadjusting circuit 120.

In S130, the slew rate adjusting circuit 120 may provide an adjustmentcurrent ADI to the output port 115 of the arithmetic amplifier 110 onthe basis of a difference between the input voltage VIN and the outputvoltage VOUT. As described above, when a difference between the inputvoltage VIN and the output voltage VOUT is equal to or greater than areference voltage, the slew rate adjusting circuit 120 may decrease atransition time to the output voltage VOUT by providing the adjustmentcurrent ADI to the arithmetic amplifier 110.

In other words, when a difference between the input voltage VIN and theoutput voltage VOUT is equal to or greater than a reference voltage, theslew rate adjusting circuit 120 may decrease a transition time to theoutput voltage VOUT by additionally providing an adjustment current ADIto the arithmetic amplifier 110. When a difference between the inputvoltage VIN and the output voltage VOUT is smaller than a referencevoltage, the slew rate adjusting circuit 120 may not provide anadjustment current ADI to the arithmetic amplifier 110. Accordingly, aslew rate of an example where a difference between the input voltage VINand the output voltage VOUT is equal to or greater than the referencevoltage may be greater than a slew rate of a case where a differencebetween the input voltage VIN and the output voltage VOUT is smallerthan the reference voltage.

According to an example, the slew rate adjusting circuit 120 maydetermine a current level of an adjustment current ADI on the basis of adifference between the input voltage VIN and the output voltage VOUT.Accordingly, when a difference between the input voltage VIN and theoutput voltage VOUT becomes large, a slew rate may become large as well,and when a difference between the input voltage VIN and the outputvoltage VOUT becomes small, a slew rate may become small as well.Accordingly, the slew rate adjusting circuit 120 may thus adaptivelyadjust a transition time to the output voltage VOUT according to a gapin magnitude between the output voltage VOUT and the input voltage VIN.

FIG. 8 is a view conceptually showing a display device including abuffer circuit according to an example. Referring to the example of FIG.8 , a display device 1000 may include a display panel 200, a displaydriving circuit 300, a gate driving circuit 400, and a timing controller500. However, this is a non-limiting example, and there may be otherelements present in addition to and/or instead of these elements inother examples.

According to examples, the display device 1000 may be a device capableof displaying an image or video. For example, the display device 1000may refer to a smartphone, a tablet personal computer, a mobile phone, avideo phone, an e-book reader, a computer, a camera, or a wearabledevice, as non-limiting examples, but the display device 1000 is notlimited to these enumerated examples and other devices with displayactivities are used as the display device 1000 in other examples.

The display panel 200 may include a number of sub-pixels P arranged inrows and columns. For example, the display panel 200 may be implementedusing any one of a light emitting diode (LED) display, an organic LED(OLED) display, an active-matrix OLED (AMOLED) display, anelectrochromic display (ECD), a digital mirror device (DMD), an actuatedmirror device (AMD), a grating light valve (GLV), a plasma display panel(PDP), an electro luminescent display (ELD), and a vacuum fluorescentdisplay (VFD), as non-limiting examples, but the display panel 200 isnot limited to these enumerated examples, and other devices providingimage/video display capabilities, such as through the use of sub-pixelsare used as the display panel 200 in other examples.

The display panel 200 may include a plurality of gate lines GL1 to GLn,where n is a natural number, arranged in rows. The display panel 200 mayalso include a plurality of data lines DL1 to DLm, where m is a naturalnumber, arranged in columns. Accordingly, display panel 200 may includesub-pixels P formed at respective intersections points between theplurality of gate lines GL1 to GLn and the plurality of data lines DL1to DLm. The display panel 200 may include a plurality of horizontallines, and one horizontal line may be configured with sub-pixels Pconnected to one gate line. During one horizontal period (1H),sub-pixels arranged in one horizontal line may be driven, and during asubsequent 1H, sub-pixels arranged in another horizontal line may bedriven.

Each of the sub-pixels P may include a light emitting diode (LED) and adiode driving circuit independently driving the LED. Each diode drivingcircuit may be connected to one gate line and one data line, and eachLED may be connected between the diode driving circuit and a powersource voltage, for example, a ground voltage, as a non-limitingexample.

Each diode driving circuit may include a switching element, for example,a thin film transistor (TFT), connected to the gate lines GL1 to GLn.When the switching element is turned on by providing a gate-on signal tothe gate lines GL1 to GLn, the diode driving circuit may provide to theLED an image signal or pixel signal provided from the data lines DL1 toDLm connected to the diode driving circuit. The LED may output anoptical signal in association with the image signal.

Each sub-pixel P may be one of a red element R outputting red light, agreen element G outputting green light, and a blue element B outputtingblue light. In the display panel 200, the red element, the greenelement, and the blue element may be arranged according to variousmethods. According to non-limiting examples, sub-pixels P of the displaypanel 200 may be arranged in an order of R, G, B, and G or B, G, R, andG in a repeated manner. For example, pixels P of the display panel 200may be arranged according to an RGB stripe structure or an RGB Pentilestructure, but the display panel 200 is not limited to these specificexamples.

The gate driving circuit 400 may sequentially provide gate-on signals tothe plurality of gate lines GL1 to GLn in response to a gate controlsignal GCS. For example, the gate control signal GCS may include a gatestart pulse indicating a start time of outputting the gate-on signalsand a gate shift clock controlling the timing of each gate-on signal.

When a gate start pulse is input, the gate driving circuit 400 maysequentially generate gate-on signals, for example, gate voltages thatare logically high, in response to a gate shift clock, and maysequentially provide the gate-on signals to the plurality of gate linesGL1 to GLn. In such an example, during a time period in which thegate-on signals are not provided to the plurality of gate lines GL1 toGLn, gate-off signals, for example, gate voltage that are logically low,may be provided to the plurality of gate lines GL1 to GLn.

The display driving circuit 300 may convert digital image data DATA toanalog image signals in response to a data control signal DCS, and mayprovide the resulting image signals to the plurality of data lines DL1to DLm. The display driving circuit 300 may also provide image signalsin association with one horizontal line to the respective plurality ofdata lines DL1 to DLm during a 1H horizontal period.

The display driving circuit 300 may include a buffer circuit 100 thattransmits signals to the data lines DL1 to DLm. Such a buffer circuit100 may be the buffer circuit 100 described with reference to theexamples of FIGS. 1 to 6 .

The buffer circuit 100 may transfer signals into the display panel 200.The display driving circuit 300 may convert image data DATA into imagesignals in response to receiving a data control signal DCS. The displaydriving circuit 300 may convert such image data into image signals ofgrayscale voltages in association with the image data DATA, and mayoutput the resulting image signals into the plurality of data lines DL1to DLm through the buffer circuit 100.

The timing controller 500 may receive external video image data RGB, andmay perform processing on the video image data RGB or may generate imagedata DATA by converting the video image data according to a structure ofthe display panel 200. Also, the timing controller 500 may transmit theimage data DATA into the display driving circuit 300.

The timing controller 500 may receive a plurality of control signalsfrom an external host device. The control signals may include ahorizontal synchronization signal Hsync, a vertical synchronizationsignal Vsync, shown collectively in the example of FIG. 8 as SYNC, and aclock signal DCLK.

The timing controller 500 may generate a gate control signal GCS, and adata control signal DCS for controlling the gate driving circuit 400 andthe display driving circuit 300, respectively, on the basis of thereceived control signals. The timing controller 500 may also controlvarious driving timings of the gate driving circuit 400 and the displaydriving circuit 300 on the basis of the gate control signal GCS and thedata control signal DCS it receives.

According to an example, the timing controller 500 may control the gatedriving circuit 400 so that the gate driving circuit 400 may providegate-on signals to the plurality of gate lines GL1 to GLn based on thegate control signal GCS. The timing controller 500 may control thedisplay driving circuit 300 so that the display driving circuit 300 mayprovide image signals to the plurality of data lines DL1 to DLm on thebasis of the data control signal DCS.

Each configuration of the display device 1000 may be employed in acircuit that may be capable of performing the corresponding function.

The buffer circuit 100, arithmetic amplifier 110, input port 111, load113, output port 115, slew rate adjusting circuit 120, adjustmentcurrent generating circuit 121, control circuit 123, display device1000, display panel 200, display driving circuit 300, gate drivingcircuit 400, and timing controller 500 in FIGS. 1-8 that perform theoperations described in this application are implemented by hardwarecomponents configured to perform the operations described in thisapplication that are performed by the hardware components. Examples ofhardware components that may be used to perform the operations describedin this application where appropriate include buffers, transistors,controllers, sensors, generators, drivers, memories, comparators,arithmetic logic units, adders, subtractors, multipliers, dividers,integrators, and any other electronic components configured to performthe operations described in this application.

While this disclosure includes specific examples, it will be apparentafter an understanding of the disclosure of this application thatvarious changes in form and details may be made in these exampleswithout departing from the spirit and scope of the claims and theirequivalents. The examples described herein are to be considered in adescriptive sense only, and not for purposes of limitation. Descriptionsof features or aspects in each example are to be considered as beingapplicable to similar features or aspects in other examples. Suitableresults may be achieved if the described techniques are performed in adifferent order, and/or if components in a described system,architecture, device, or circuit are combined in a different manner,and/or replaced or supplemented by other components or theirequivalents. Therefore, the scope of the disclosure is defined not bythe detailed description, but by the claims and their equivalents, andall variations within the scope of the claims and their equivalents areto be construed as being included in the disclosure.

What is claimed is:
 1. A slew rate adjusting circuit, comprising: anadjustment transistor configured to provide an adjustment current intoan output port of an arithmetic amplifier in response to the adjustmenttransistor being turned on; a first transistor connected between a powerline of the arithmetic amplifier and the adjustment transistor; and asecond transistor connected between the first transistor and an outputnode of the output port, wherein the adjustment transistor is configuredto be turned on by the second transistor in response to a differencebetween an input voltage and an output voltage being equal to or greaterthan a reference voltage.
 2. The slew rate adjusting circuit of claim 1,wherein the adjustment current is provided from the power line into theoutput node through the adjustment transistor.
 3. The slew rateadjusting circuit of claim 1, wherein the second transistor isconfigured to be turned on in response to the difference between theinput voltage and the output voltage being equal to or greater than thereference voltage, and wherein the adjustment transistor is configuredto be turned on in response to the second transistor being turned on,and the adjustment current is provided to the output node through theadjustment transistor in response to the adjustment transistor beingturned on.
 4. The slew rate adjusting circuit of claim 1, wherein theadjustment transistor, the first transistor, and the second transistorare metal-oxide-semiconductor field-effect transistors (MOSFETs), andwherein a source terminal of the second transistor is connected to theoutput node, a drain terminal of the second transistor is connected to agate terminal of the adjustment transistor, a source terminal of theadjustment transistor is connected to the power line, and a drainterminal of the adjustment transistor is connected to the output node.5. The slew rate adjusting circuit of claim 1, wherein the adjustmenttransistor and the second transistor are metal-oxide-semiconductorfield-effect transistors (MOSFETs), and wherein a source terminal of thesecond transistor is connected to the output node, a drain terminal ofthe second transistor is connected to a gate terminal of the adjustmenttransistor, a source terminal of the adjustment transistor is connectedto the power line, and a drain terminal of the adjustment transistor isconnected to the output node.
 6. The slew rate adjusting circuit ofclaim 1, further comprising an enable transistor connected to theadjustment transistor, the first transistor, and the second transistor,wherein the enable transistor is configured to control whether or not toturn on the second transistor in response to receiving an enable signal.7. The slew rate adjusting circuit of claim 1, wherein a positiveadjustment current is provided through the adjustment transistor inresponse to the arithmetic amplifier operating through a pull-upcurrent.
 8. The slew rate adjusting circuit of claim 1, wherein anegative adjustment current is provided through the adjustmenttransistor in response to the arithmetic amplifier operating through apull-down current.
 9. The slew rate adjusting circuit of claim 1,further comprising an additional transistor connected to the adjustmenttransistor, the first transistor, and the second transistor, wherein thesecond transistor is configured to turn on the additional transistor inresponse to the difference between the input voltage and the outputvoltage being equal to or greater than the reference voltage, andwherein an additional current is provided to the output node in responseto the additional transistor being turned on.